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Background Information | Radiation sources and effects | |
Dose models |
Jun, I., M. A. Xapsos, S. R. Messenger, E. A. Burke, R. J. Walters, G. P. Summers, and T. Jordan, Proton Nonionizing Energy Loss (NIEL) for Device Applications, IEEE Trans. Nucl. Sci., 50, 1924-1928, 2003.
Messenger, S. R., E. A. Burke, M. A. Xapsos, G. P. Summers, R. J. Walters, I. Jun, and T. M. Jordan, NIEL for heavy ions: An analytical approach, IEEE Trans. Nucl. Sci., 1919-1923, 2003.
Summers, G. P., E. A. Burke, P. Shapiro, S. R. Messenger, and R. J. Walters, Damage correlations in semiconductors exposed to gamma, electron and proton radiations, IEEE Trans. Nucl. Sci., 40, 1372-1379, 1993.
P. Truscott, "JORE2M2 Project: SHIELDOSE-2Q Requirements, Interface Control, Design, Implementation and Justification Document," QINETIQ/TS/AS/SDD0900017, 2010.
P. Truscott, "JORE2M2 Project: SHIELDOSE-2Q Software User Manual," QINETIQ/TS/AS/SUM1003576, 2010.