6.6.2                 Material characterization tests

a.              A material characterization test need not be performed for a material, if it is only used in assemblies for which tests have been performed at assembly level.

b.              Except in the case specified in 6.6.2a, each new non-conductive material that has never flown on a spacecraft shall be tested under realistic irradiation conditions in terms of electron spectrum and across the temperature range to be used, to prove that there is no ESD risk.

c.               Materials shall be tested separately in order to evaluate electrostatic risk through knowledge of their electrical properties, including:

1.              bulk (intrinsic) conductivity,

2.              surface conductivity,

3.              radiation-induced conductivity,

4.              relative permittivity, and

5.              discharge threshold level

d.              The minimum size of the sample under test shall be above 30 mm  30 mm.

NOTE              A good quality measurement of the surface voltage can be made with this size.

e.               Sample thickness and physical properties shall be representative of flight configuration.