Table 10‑1: Summary of possible radiation-induced background effects as a function of instrument technology (Part 3 of 3) |
Comments |
Discrete line emission |
Electrons usually ignored due to high shielding conditions |
|
Radiation sources |
Protons & heavier nuclei Electrons |
Protons & heavier nuclei, including secondary nucleons |
|
|
Effect |
Direct ionisation of the cathode or dynode by a particle producing secondary electrons Scintillation in optical components of the PMT Cerenkov radiation induced in optical components, or above Cerenkov threshold of other materials |
Charging of test mass by ionising particles, including secondary electron emission Energy deposition leading to thermal changes to test-mass or superconducting materials |
|
|
Example |
|
LISA |
|
|
Instrument
/ |
Photomultipliers and micro-channel plates |
Free-floating test mass interferometer |
|
|
Application |
UV, optical and IR detectors |
gravity-wave detectors |