a. Except in the case specified in requirement 9.5.3b, the proton or neutron contribution to error rate shall be calculated as follows:
(a) the cross-section experimental curve giving saturation, and
(b) two other cross section/energy points in the following ranges:
- For protons, in the energy range 10 MeV - 200 MeV.
- For neutrons, from thermal energies to 200 MeV.
2. Use one of the following formulas to calculate the SEE rates:
o
From the environment proton or
neutron fluxes and SEE cross sections:
o
By considering the dependence
of the angle of incidence, but assuming not azimuth angle dependence:
o By simplifying the previous formula, by
- defining σmax(E) as the value of σ(E,q) at the angle q where the cross section maximises for that energy, and
- If the incident proton or neutron flux is anisotropic (and therefore cannot be approximated to an isotropic flux), approximate dΦ/dE to the angle-averaged incident flux if used in conjunction with the maximum cross section data, σmax(E).
where:
dΦ/dE = differential proton or neutron flux spectrum as a function of energy;
EMin = minimum energy of the differential energy neutron spectrum;
EMax = maximum energy of the differential energy spectrum;
σnucleon(E) = proton or neutron SEE cross section as a function of energy.
1. Obtain the proton cross-section curve by simulation and correlation with experimental data, using a simulation tool agreed with the customer.
2. Using the integral or differential energy spectra for protons or neutrons specified in the radiation environment specification, obtain two other cross section/energy points in the following ranges:
o For protons, in the energy range 10 MeV - 200 MeV.
o For neutrons, from thermal energies to 200 MeV.
3. Calculate the SSE rate, from ion-beam irradiations, by using the following formula:
where:
dΦ/dE, : EMin, EMax, and σnucleon(E) have the same meaning as in 9.5.3a2, and:
dP/de(E,e) = differential energy deposition spectrum for protons/neutrons of energy E depositing energy e within the sensitive volume;
eC = critical or threshold energy deposition for inducing SEE;
eMax = maximum energy deposition defined for energy deposition spectrum;
σion(LET) = SEE cross section for ions as a function of LET for normally incident ions;
h = height of sensitive volume;
ρ = mass density of semiconductor;
ssample = area of cell sampled by proton/neutron simulation to obtain energy deposition spectrum.
NOTE Rational and discussion on the calculation of SEE rates of protons and neutrons can be found in Section 8.5.5 to 8.5.7.