9.3 Technologies susceptible to single event effects

a. If one of the technologies identified in Table 9‑1 is used in spacecraft and planetary-mission systems, the SEE probability and effects shall be analysed.

NOTE 1 As specified in Clauses 7, 8 and 10, the susceptibility of many of these components is also analysed for other radiation effects (such as total ionising dose and displacement damage).

NOTE 2 As technologies evolve and new phenomena are identified, it can be the case that this table does not fully represent the technologies and effects.

NOTE 3 Derating is employed in the RHA programme to ensure that the device operates in a manner so as to be insensitive to SEE effects.

Table 9‑1: Possible single event effects as a function of component technology and family.

Component type	Technology	Family	Function	SEL	SESB	SEGR	SEB	SEU	MCU/SMU	SEDR	SEHE	SEFI	SET	SED
Transistors	Power MOS					X	X
ICs	CMOS or BiCMOS or SOI	Digital	SRAM	X*				X	X		X
			DRAM/ SDRAM	X*	X			X	X		X	X
			FPGA	X*				X		X		X		X
			EEPROM/ Flash EEPROM	X*						X		X		X
			μP/ μcontroller	X				X			X	X		X
		Mixed	ADC	X*				X				X	X	X
		Signal	DAC	X*				X				X	X	X
		Linear		X*						X			X
	Bipolar	Digital						X					X
		Linear						X					X
Opto-electronics			Opto-couplers										X
			CCD										X
			APS (CMOS)	X								X	X
*except SOI