a. A surface charging analysis shall be performed, including:
1. A systematic inventory of all surface materials, their resistivity, area and thickness.
2. A systematic inventory of triple-points, floating conductors and multiple-conductor element components.
b. In the event that some dielectric surfaces are left more insulating than specified in 6.3.3.6, requirements in 6.3.3.2 shall be verified by computational analysis, test or similarity.
c. Computational modelling and laboratory testing shall model the effects of the phenomenon related to surface particle emission (secondary emission and photo-emission), conduction and collection processes.
NOTE 1 Annex D describes some charging codes that can form part of this analysis.
NOTE 2 Many materials suitable for space use are found in ECSS-Q-ST-70-71.