Table 4‑3: Summary of radiation effects and cross-references to other chapters
(Part 1 of 2)
Sub-system or component |
Technology |
Effect |
ECSS-E-ST-10-12 main clause cross-reference |
ECSS-E-HB-10-12 Section |
Integrated circuits |
Power MOS |
TID SEGR SEB |
7 |
6 8.6.2 8.6.3 |
CMOS |
TID SEE (generally) |
9 |
6 8 |
|
Bipolar |
TNID SEU SET TID |
8 |
7.4.2 8.7.1 8.7.5 6 |
|
BiCMOS |
TID TNID SEE (generally) |
9 |
6 7.4.2 8 |
|
SOI |
TID SEE (generally exc. SEL) |
6 8 |
||
Optoelectronics and sensors (1) |
MEMS a |
TID |
6 |
|
CCD |
TNID TID Enhanced background |
7.4.3 6 9.2, 9.4 |
||
CMOS APS |
TNID TID SEE (generally) Enhanced background |
7.4.4 6 8 9.2, 9.4 |
||
Photodiodes |
TNID TID SET |
7.4.5 6 8.7.5 |
||
LEDs |
TNID TID |
7.4.7 6 |
||
laser LEDs |
TNID TID |
7.4.7 6 |
||
Opto-couplers |
TNID TID SET |
7.4.8 6 8.7.5 |